Public tender

Wafer Probers for Millimeter Wave Circuit Characterization up to 250 GHz

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Source ID: TED-3470dab6-6f68-42c5-8fad-75d3b14b0453

openGermany

Scope overview

2 pieces: Prober 300mm For the automated characterization of circuits in the millimetre wave range up to approx. 250 GHz by means of S-parameter and power measurements, two wafer probers are required that meet the highest requirements for positioning accuracy. Contact areas ("pads") of approx. 10µm must be able to be approached precisely and with high reproducibility over a "wafer" area of ø300 mm.

As the height of these wafers can vary by approx. ±10µm, automatic height correction (Z-profiling) is required. Temperature control of the chuck is necessary.

Statusopen
CategoryOther
CountryGermany
Publish dateJan 9, 2026
Submission deadlineFeb 10, 2026
Estimated value
Notice typetender_notice
Sourceeu-ted-search
BuyerFraunhofer-Gesellschaft - Einkauf B12
Buyer websitehttps://ted.europa.eu/
City

Buyer & contacts

Contacts available
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Contact name
Einkauf Betrieb und InfrastrukturUnlock export & alerts
Email
einkauf@zv.fraunhofer.deUnlock export & alerts
Phone
+49891205-0Unlock export & alerts
Organization
Fraunhofer-Gesellschaft - Einkauf B12Unlock export & alerts

Tags & Signals

wafer probermillimeter wave characterizationS-parameter measurements300mm waferpositioning accuracyautomatic height correctiontemperature-controlled chuckcircuit testing
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